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Scanning Probe Investigation of Mechanisms of Fatigue in PZT
Scope and goals of research project:
Polarization fatigue (the loss of switchable polarization due to switching) is one of the most problematic degradation effects preventing the adoption of ferroelectric nonvolatile memories in the electronics industry. By comparing nanoscale differences between switching behaviors in fatigued and unfatigued samples we seek to determine whether fatigue is a result of some modification of the process of switching, and, if so, determine the mechanism of the modification. |
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| Figure 1: |
Image set of fatigued PZT prior to poling.
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| Figure 2: |
Image set of fatigued PZT after poling.
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