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Year
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Title
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Author
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| 2007 |
The Influence of a TiN Buffer Layer on the PECVD Growth and Field Emission Properties of Carbon Nanotubes |
Eugene Bryan |
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[ABSTRACT]
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| 2007 |
Electronic Transition Imaging of Carbon Based Materials: The Photothreshold of Melanin and Thermionic Field Emission from Diamond. |
Jacob Garguilo |
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[ABSTRACT]
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| 2007 |
In Situ, Real-Time Characterization of Silicide Nanostructure Coarsening Dynamics by Photo-Electron Emission Microscopy |
Matthew C Zeman |
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[ABSTRACT]
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| 2005 |
Spectroscopic Study of the Interface Chemical and Electronic Properties of High-κ Gate Stacks |
Charles C Fulton |
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[ABSTRACT]
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| 2004 |
Formation of Metal Silicide and Metal Germanosilicide Contacts to Si1-xGex Alloys |
James Burnette |
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[ABSTRACT]
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| 2004 |
Raman Scattering Analysis of Structural Transformations due to Precision Engineered Si, 6H-SiC and β-Si3N4. |
Jennifer Jean Huening Walter |
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[PDF]
[ABSTRACT]
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| 2004 |
Synthesis and Field Emission Properties of Carbon Nanotube Films |
YunYu Wang |
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[ABSTRACT]
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| 2003 |
Nanoscale investigation of the piezoelectric properties of perovskite ferroelectrics and III-nitrides |
Brian J Rodriguez |
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[PDF]
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| 2003 |
Electrical, Chemical, and Structural Characterization of Au Schottky Contacts on Remote Plasma-Treated n-Type ZnO{0001} |
Brian Joseph Coppa |
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[ABSTRACT]
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| 2003 |
Thermionic Emission from Doped and Nanocrystalline Diamond |
Franz Köck |
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[ABSTRACT]
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| 2003 |
Direct Bonding of Gallium Nitride to Silicon Carbide: Physical, and Electrical Characterization |
Jaeseob Lee |
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[ABSTRACT]
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| 2003 |
Dynamics of Erbium Silicide and Germanium Nanostructure Formation on Silicon Surfaces |
Lena Fitting |
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[ABSTRACT]
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| 2003 |
Photoemissino Investigation of the Electronic Properties of Ga-face GaN (0001)-Dielectrics Interfaces |
Ted E. Cook Jr. |
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[PDF]
[ABSTRACT]
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| 2002 |
Effects of Strain Relaxation in SiGe Growth on Uniquely Oriented Si Substrates |
Morgan E. Ware |
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[ABSTRACT]
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| 2002 |
Electrical, Chemical, and Structural Characterization of the Interface Formed Between Ni/Au and Pd/Au Ohmic Contacts and Cleaned p-type GaN(0001) Surfaces |
Philip John Hartlieb |
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[PDF]
[ABSTRACT]
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| 2001 |
Electrical Characterization of TiSi2 Nanoscale Islands by Scanning Probe Microscopy |
Jaehwan Oh |
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[PDF]
[ABSTRACT]
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| 2001 |
In Situ, Real Time Characterization and Growth of Metal Silicide Islands on Si Surfaces by Photo Electron Emission Microscopy |
Woochul Yang |
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[PDF]
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| 2000 |
Correlation of Surface Properties with Electron Emission Characteristics for Wide Bandgap Semiconductors |
Brandon Lea Ward |
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[ABSTRACT]
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| 2000 |
Thermostability of the 6H-SiC(0001)Si Surface Observed with Photo-Emission Electron Mircoscopy (PEEM) |
Christian Petrich |
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[PDF]
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| 2000 |
Characterization of the Growth of Aluminum Nitride and Gallium Nitride Thin Films on Hydrogen Etched and/or Cleaned 6H-SiC (0001) Surfaces |
Jeffrey David Hartman |
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[PDF]
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| 2000 |
Deposition and Electrical, Chemical and Microstructural characterization of the Interface Formed Between Pt, Au and Ag Rectifying Contacts on Clean N-Type GaN (0001) Surfaces |
Kieran Mark Tracy |
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[PDF]
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| 1999 |
Characterization of Field Emission Properties of Nitrogen-Doped Diamond |
Andrew T. Sowers |
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[PDF]
[ABSTRACT]
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| 1999 |
Scanning Tunneling Microscopy of Nanoscale Structures of Titanium Disilicide on Clean Silicon Surfaces |
Hoon Ham |
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[PDF]
[ABSTRACT]
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| 1999 |
Piezoelectric Measurements Using an Atomic Force Microscope |
James Allen Christman |
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[PDF]
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| 1999 |
Photoemission of Silicon Carbide Surfaces and Interfaces |
Mike Lowery O'Brien |
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[PDF]
[ABSTRACT]
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| 1999 |
Cobalt Disilicide Contacts to Si1-xGex Alloys |
Peter Thomas Goeller |
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[ABSTRACT]
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| 1999 |
Surface Morphology and Chemical Characterization of Si Surfaces Prepared with HF/Alcohol Vapor Phase Chemistries |
Richard Jerome Carter |
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[PDF]
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| 1998 |
The Investigation of Hydrogen Plasma Processing for Backend Cleaning |
Ambika Somashekhar |
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[PDF]
[ABSTRACT]
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| 1998 |
Interface Stability of Titanium Silicide on 6H-Silicon Carbide (0001) |
Andrew James Stoltz Jr. |
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[PDF]
[ABSTRACT]
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| 1998 |
In-Situ Remote RF Plasma Cleaning and Surface Characterization after SiO2/Si RIE |
Hong (Helen) Ying |
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[PDF]
[ABSTRACT]
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| 1998 |
Photoemission Electron Microscopy of Diamond Thin Films |
Steven L. English |
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[PDF]
[ABSTRACT]
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| 1997 |
Morphology and Mechanisms of ZrSi2 and TiSi2 on Silicon |
Catherine Anne Sukow |
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[PDF]
[ABSTRACT]
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| 1997 |
Processing of Si(100) Surfaces by a Remote RF H2 and H2/SiH4?Plasma to Remove Surface Contaminants |
John Paul Barnak |
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[PDF]
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| 1997 |
Electronic Properties Of SiC and AlN Surfaces and Interfaces |
Mark C. Benjamin |
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[PDF]
[ABSTRACT]
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| 1997 |
Electron Affinity and Electron Emission from Diamond Sirfaces and Metal-Diamond Interfaces |
Peter Karl Baumann |
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[PDF]
[ABSTRACT]
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| 1997 |
Surface and Interface Characterization of SiC and III-V Nitrides |
Sean W. King |
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[PDF]
[ABSTRACT]
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| 1996 |
Surface Morphology of Nanoscale TiSi2 Epitaxial Islands on Roughened Si (100) and their Schottky Barrier Height |
Friso Jedema |
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[PDF]
[ABSTRACT]
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| 1996 |
Emission Studies of Diamond And Cubic Boron Nitride Crystallites Bonded to Metallic Substrates |
Michael Austin Netzer, Jr. |
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[PDF]
[ABSTRACT]
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| 1995 |
CHARACTERIZATION OF THE SOLID PHASE REACTION OF TITANIUM WITH SILICON GERMANIUM ALLOYS: INTERFACE REACTIONS, PHASE FORMATION, AND STABILITY |
David Brian Aldrich |
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[PDF]
[ABSTRACT]
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| 1995 |
In situ Characterization of Oxide Thin Film Growth |
Eric James Watko |
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[PDF]
[ABSTRACT]
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| 1995 |
Properties of SixGe1-x Alloy Surfaces and Co/SixGe1-x Interfaces |
Ja-Hum Ku |
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[PDF]
[ABSTRACT]
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| 1995 |
PROPERTIES OF SiXGe1-X ALLOY SURFACES AND Co/SiXGe 1-X INTERFACES |
JA-HUM KU |
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[PDF]
[ABSTRACT]
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| 1995 |
Materials and Device Analysis of Hydrogen Plasma Prepared Silicon Surfaces |
Jeffrey Scott Montgomery |
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[PDF]
[ABSTRACT]
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| 1995 |
Photoluminescence and Raman Analysis of Impurities and Defects in Diamond Films |
Leah Bergman |
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[PDF]
[ABSTRACT]
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| 1995 |
Photoemission from BN and secondary electron emission from negative electron affinity surfaces |
Michael John Powers |
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[PDF]
[ABSTRACT]
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| 1995 |
Growth And Characterization Of (Ti1-xZrx)Si2 Thin Films On Silicon |
Yuan Dao |
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[PDF]
[ABSTRACT]
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| 1994 |
PHOTOPHORETIC DEFLECTION OF PARTICLES IN SUBATMOSPHERIC PRESSURE CHAMBERS |
Julian Selvaraj |
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[PDF]
[ABSTRACT]
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| 1994 |
Development and characterization of single and multi-layered TiSi2-island structures |
M. Slotboom |
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[PDF]
[ABSTRACT]
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| 1994 |
Influence of surface-roughness on formation of TiSi2-islands |
Rob Analbers |
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[PDF]
[ABSTRACT]
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| 1994 |
Nucleation and Growth Processes of Homoepitaxial Diamond |
Shawn L. Wagoner |
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[PDF]
[ABSTRACT]
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| 1994 |
Nucleation and Growth Processes of Homoepitaxial Diamond |
Shawn Leigh Wagoner |
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[PDF]
[ABSTRACT]
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| 1994 |
THE CHARACTERIZATION OF STRAIN, IMPURITY CONTENT AND CRUSH STRENGTH OF SINGLE CRYSTAL DIAMONDS |
TERRI LYNN MCCORMICK |
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[PDF]
[ABSTRACT]
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| 1994 |
THE CHARACTERIZATION OF STRAIN, IMPURITY CONTENT AND CRUSH STRENGTH OF SINGLE CRYSTAL DIAMONDS |
Terri Lynn McCormick |
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[PDF]
[ABSTRACT]
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| 1994 |
Hydrogen Plasma Interactions with Silicon Surfaces |
Thomas P. Schneider |
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[PDF]
[ABSTRACT]
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| 1993 |
Surface and Interface Morphology of Small Islands of TiSi2 and ZrSi2 on (001) Silicon |
B, L. Kropman |
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[PDF]
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| 1993 |
Properties of Diamond Surfaces and Metal-Diamond Interfaces: Schottky Barrier Heights and Negative Electron Affinity Effects |
Jaap van der Weide |
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[PDF]
[ABSTRACT]
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| 1992 |
Surface Structure and Surface Electronic States Related to Plasma Cleaning of Si and Ge |
Jaewon Cho |
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[PDF]
[ABSTRACT]
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| 1992 |
A Study of the Nucleation and Growth of Diamond on Silicon by Scanning Tunneling Microscopy and Spectroscopy |
Kevin Francis Turner |
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[PDF]
[ABSTRACT]
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| 1991 |
Scanning Tunneling Microscopy and Spectroscopy of Doped Silicon and Titanium Silicide Thin Films. |
John Vincent LaBrasca |
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[PDF]
[ABSTRACT]
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| 1990 |
Initial Reactions, Surface and Interface Morphologies, Phase Transition, and Epitaxial Growth of TiSi2 Formed b Thin Film Reaction in Ultrahigh Vacuum. |
Hyeongtag Jeon |
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[PDF]
[ABSTRACT]
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| 1990 |
RAMAN AND INFRARED CHARACTERIZATION OF DIAMOND THIN FILMS |
Yvonne Marie LeGrice |
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[PDF]
[ABSTRACT]
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| 1988 |
MOLYBDENUM SILICIDE FORMATION ON SINGLE CRYSTAL, POLYCRYSTALLINE AND AMORPHOUS SILICON: GROWTH, STRUCTURE AND ELECTRICAL PROPERTIES |
Charles M. Doland |
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[PDF]
[ABSTRACT]
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| 1988 |
Diamond and Diamond-Like Thin Films: A Raman Scattering Analysis of Carbon Bonding |
Robert E. Shroder |
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[PDF]
[ABSTRACT]
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| 1988 |
RAMAN CHARACTERIZATION OF THE Ti/Si THIN FILM SYSTEM |
Robert William Fiordalice |
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[PDF]
[ABSTRACT]
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