Journal Articles

Year
Num
Title
Author
Journal
Page
2006 0 The effect of Schottky barrier lowering and nonplanar emitter geometry on the performance of a thermionic energy converter Joshua Smith, Robert Nemanich, Griff Bilbro Diamond and Related Materials 870
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2006 0 Using negative electron affinity diamond emitters to mitigate space charge in vacuum thermionic energy conversion devices Joshua Smith, Robert Nemanich, Griff Bilbro ICNDST/ADC 0
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2006 0 The effect of negative electron affinity materials on space charge mitigation of vacuum thermionic energy conversion devices Joshua Smith, Robert Nemanich, Griff Bilbro European Diamond Conference 0
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2006 0 Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy M.C. Zeman, C.C. Fulton, W.-C. Yang, G. Lucovsky, and R.J. Nemanich J. Appl. Phys. 99 23519
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2005 0 Direct studies of domain switching dynamics in thin film ferroelectric capacitors A. Gruverman, B. J. Rodriguez, C. Dehoff, J. D. Waldrep, A. I. Kingon, R. J. Nemanich, and J. S. Cross Appl. Phys. Lett. 87, 082902 (2005) 0
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2005 0 Oxidation Potentials of Human Eumelanosomes and Pheomelanosomes Alexander Samokhvalov, Lian Hong, Yan Liu, Jacob Garguilo, Robert J. Nemanich, Glenn S. Edwards and John D. Simon Photochemistry and Photobiology 145
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2005 0 Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy B. J. Rodriguez, R. J. Nemanich, A. Kingon, A. Gruverman, S. V. Kalinin, K. Terabe, X. Y. Liu, and K. Kitamura Appl. Phys. Lett. 86, 012906 (2005) 0
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2005 0 Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures B. J. Rodriguez, W.-C. Yang, R. J. Nemanich, and A. Gruverman Appl. Phys. Lett. 86, 112115 (2005) 0
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2005 0 Investigation of the mechanism of polarization switching in ferroelectric capacitors by three-dimensional piezoresponse force microscopy B.J. Rodriguez, A. Gruverman, A.I. Kingon, R.J. Nemanich and J.S. Cross Applied Physics A: Materials Science & Processing 80, 99-103 (2005) 99
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2005 0 Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors C. Dehoff, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, A. Gruverman, and J. S. Cross Rev. Sci. Instrum. 76, 023708 (2005) 23708
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2005 0 Thermionic and Field Electron Emission from Nanostructured Carbon Materials for Energy Conversion and Vacuum Electronics Franz A.M. Koeck, Yunyu Yang, Robert J. Nemanich Proceedings of IECON05 0
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2005 0 Applications of Free-Electron Lasers in the Biological and Material Sciences G. S. Edwards, S. J. Allen, R. F. Haglund, R. J. Nemanich, B. Redlich, J. D. Simon and W.-C. Yang Photochemistry and Photobiology, 81 711
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2005 0 Thermionic field emission from nanocrystalline diamond-coated silicon tip arrays Garguilo JM, Koeck FAM, Nemanich RJ, Xiao XC, Carlisle JA, Auciello O PHYSICAL REVIEW B 0
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2005 0 Simultaneous Elastic and Electromechanical Imaging by Scanning Probe Microscopy: Theory and Applications to Ferroelectric and Biological Materials J. Shin, B.J. Rodriguez, A.P. Baddorf, T. Thundat, E. Karapetian, M. Kachanov, A. Gruverman, S.V. Kalinin J. Vac. Sci. Technol. B 23, 2102 (2005) 0
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2005 0 A Model for the Effect of Schottky Barrier Lowering and Non-Planar Emitter Geometry on the Performance of a Thermionic Energy Converter Joshua Smith, Robert Nemanich, Griff Bilbro European Diamond Conference 0
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2005 0 AlN bulk crystals grown on SiC seeds R. Dalmau, R. Schlesser, B.J. Rodriguez, R.J. Nemanich and Z. Sitar Journal of Crystal Growth Volume 281, Issue 1 , 15 July 2005, Pages 68-74 0
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2005 0 Nanoelectromechanics of polarization switching in piezoresponse force microscopy S. V. Kalinin, A. Gruverman, B. J. Rodriguez, J. Shin, A. P. Baddorf, E. Karapetian, and M. Kachanov J. Appl. Phys. 97, 074305 (2005) 0
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2005 0 Electromechanical imaging of biological systems with sub-10 nm resolution S. V. Kalinin, B. J. Rodriguez, S. Jesse, T. Thundat, and A. Gruverman Appl. Phys. Lett. 87, 053901 (2005) 0
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2005 0 Photo electron emission microscopy of polarity-patterned materials W-C Yang, B J Rodriguez, AGruverman and R J Nemanich J. Phys.: Condens. Matter 17 (2005) S1415–S1426 0
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2005 0 Preparation and characterization of atomically clean, stoichlometric surfaces of AIN(0001) W. J. Mecouch, B. P. Wagner, Z. J. Reitmeier, R. F. Davis, C. Pandarinath, B. J. Rodriguez, and R. J. Nemanich JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 23 (1): 72-77 JAN-FEB 2005 72
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2005 0 Initial Stages of Growth of Gallium Nitride via Iodine Vapor Phase Epitaxy W.J. Mecouch , B.J. Rodriguez , Z.J. Reitmeier, J-S. Park, R.F. Davis, and Z. Sitar Mater. Res. Soc. Symp. Proc. 831, E3.23.1, 2005. 0
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2004 0 Photoionization Threshold of Eumelanosomes Determined Using UV Free Electron Laser-Photoelectron Emission Microscopy Alexander Samokhvalov, Jacob Garguilo, W.-C. Yang, Glenn S. Edwards, Robert J. Nemanich, and John D. Simon J. Phys. Chem. B 108 16334
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2004 0 In situ cleaning and characterization of oxygen- and zinc-terminated, n-type, ZnO{0001} surfaces B. J. Coppa, C. C. Fulton, P. J. Hartlieb, R. F. Davis, B. J. Rodriguez, B. J. Shields, R. J. Nemanich J. Appl. Phys 95(10) 5856
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2004 0 Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross J. Appl. Phys. 1958
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2004 0 Process-dependent band structure changes of transition-metal (Ti,Zr,Hf) oxides on Si (100) C. C. Fulton, G. Lucovsky, and R. J. Nemanich Appl. Phys. Lett. 84(4) 580
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2004 0 Interface instabilities and electronic properties of ZrO2 on silicon (100) C. C. Fulton, T. E. Cook, Jr., G. Lucovsky, and R. J. Nemanich J. Appl. Phys. 96(5) 2665
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2004 0 Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 layers sandwiched between thicker SiO2 layers C. L. Hinkle, C. Fulton, R. J. Nemanich and G. Lucovsky Applied Surface Science (234) 240
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2004 0 Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 (ZrO2) layers sandwiched between thicker SiO2 layers C.L. Hinkle,C. Fulton, R.J. Nemanich, G Lucovsky Surface Science 1185
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2004 0 Direct correlation of surface morphology with electron emission sites for intrinsic nanocrystalline diamond films F.A.M. Kock, J.M. Garguilo, R.J. Nemanich Diamond and Related Materials 13 1022
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2004 0 On the thermionic emission from nitrogen-doped diamond films with respect to energy conversion F.A.M. Koeck, J.M. Garguilo, R.J. Nemanich Diamond & Related Materials 13 2052
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2004 0 A novel approach for determining the effective tunneling mass of electrons in HfO2 and other high-K alternative gate dielectrics for advanced CMOS devices Hinkle CL, Fulton C, Nemanich RJ, Lucovsky G MICROELECTRONIC ENGINEERING (72) 257
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2004 0 Fibrinogen adsorption onto microwave plasma chemical vapor deposited diamond films J.M. Garguilo, B.A. Davis, M. Buddie, F.A.M. Kock, R.J. Nemanich Diamond and Related Materials 595
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2004 0 Modeling Thermionic Energy Conversion Joshua Smith, Robert Nemanich, Griff Bilbro ONR TEC MURI December Meeting 0
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2004 0 X-ray absorption spectra for transition metal high- dielectrics: Final state differences for intra- and inter-atomic transitions Lucovsky G, Hong JG, Fulton CC, Zou Y, Nemanich RJ, Ade H JVST B (22) 2132
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2004 0 Spectroscopic studies of metal high-k dielectrics: transition metal oxides and silicates, and complex rare earth/transition metal oxides Lucovsky G, Hong JG, Fulton CC, Zou Y, Nemanich RJ, Ade H, Scholm DG, Freeouf JL PHYSICA STATUS SOLIDI B (241) 10 2221
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2004 0 Raman spectroscopy of diamond and doped diamond Steven Prawer and Robert J. Nemanich Phil. Trans. R. Soc. Lond. A 362 2537
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2004 0 Polarization-dependent electron affinity of LiNbO3 surfaces W.-C. Yang, B. J. Rodriguez, A. Gruverman, and R. J. Nemanich Appl. Phys. Lett. 85, 2316 (2004) 2316
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2004 0 Role of thin Fe catalyst in the synthesis of double- and single-wall carbon nanotubes via microwave chemical vapor deposition Y. Y. Wang, S. Gupta, and R. J. Nemanich Applied Physics Letters 85 2601
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2004 0 Increased field emission site density from re-grown carbon nanotube films Y. Y. Wang, S. Gupta, M. L. Liang R. J. Nemanich Journal of Applied Physics 0
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2004 0 Experimental studies of the formation process and morphologies of carbon nanotubes with bamboo mode structures Y.Y. Wang, G.Y. Tang, F.A.M. Koeck, Billyde Brown, J.M. Garguilo, R.J. Nemanich Diamond and Related Materials 13 1287
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2003 0 Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors A. Gruverman, B. J. Rodriguez, A. I. Kingon, R. J. Nemanich, J. S. Cross, and M. Tsukada Applied Physics Letters 3071
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2003 0 Mechanical Stress Effect On Imprint Behavior Of Integrated Ferroelectric Capacitors A. Gruverman, B.J. Rodriguez, A.I. Kingon, R.J. Nemanich, A.K. Tagantsev, J.S. Cross, M. Tsukada Applied Physics Letters 728
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2003 0 Gold Schottky contacts on oxygen plasma-treated, n-type ZnO(000-1) B. J. Coppa, R. F. Davis, and R. J. Nemanich Appl. Phys. Lett. 82 400
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2003 0 Spatial Distribution of Electron Emission Sites for Sulfur Doped F.A.M. Kck, J.M. Garguilo, R.J. Nemanich, S. Gupta, B. R. Weiner, and G. Morell Diamond and Related Materials, 12, (2003) 474
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2003 0 Electronic structure of transition metal high-k dielectrics: interfacial band offset energies for microelectronic devices Gerald Lucovsky, Gilbert B. Rayner, Jr. , Yu Zhang, Charles C. Fulton, Robert J. Nemanich, Guenther Appel, Harald Ade and Jerry L. Whitten Applied Surface Science, 212 563
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2003 0 Characterization of hydrogen etched 6H--SiC(0001) substrates and subsequently grown AlN films J. D. Hartman, A. M. Roskowski, Z. J. Reitmeier, K. M. Tracy, R. F. Davis, and R. J. Nemanich J. Vac. Sci. Technol. A 21 394
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2003 0 High-pressure phase transformation of silicon nitride John Patten, Ronnie Fesperman, Satya Kumar, Sam McSpadden, Jun Qu, Michael Lance, Jennifer Huening, Robert Nemanich Appl. Phys. Lett. 83 (23) 4740
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2003 0 Preparation and characterization of atomically clean, stoichiometric surfaces of n- and p-type GaN(0001) K. M. Tracy, W. J. Mecouch, R. F. Davis, and R.J. Nemanich Journal of Applied Physics, 94 (5) 3163
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2003 377 Fibrous structures on diamond and carbon surfaces formed by hydrogen plasma under direct-current bias and field electron-emission properties Koji Kobashi, Takeshi Tachibana, Yoshihiro Yokota, Nobuyuki Kawakami, Kazushi Hayashi , Kazuhiro Yamamoto, Yoshinori Koga, and Shuzo Fujiwara , Yasuhito Gotoh, Hironori Nakahara, Hiroshi Tsuji, and Junzo Ishikawa , Franz A. Koeck and Robert J. Nemanich J. Mater. Res. 18 305
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2003 0 R&D of diamond films in the Frontier Carbon Technology Project and related topics Koji Kobashi, Yoshiki Nishibayashi, Yoshihiro Yokota, Yutaka Ando, Takeshi Tachibana, Nobuyuki Kawakami, Kazushi Hayashi, Kenichi Inoue, Kiichi Meguro, Hiroshi Imai, Hiroshi Furuta, Takashi Hirao, Kenjiro Oura, Yasuhito Gotoh, Hironori Nakahara, Hiroshi T DIAM RELAT MATER 12, 3-7, March-July 2003 233
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2003 0 Influence of strain, surface diffusion and Ostwald ripening on the evolution of nanostructures for erbium on Si(001) Lena Fitting, M. C. Zeman, W.-C. Yang, and R. J. Nemanich J. Appl. Phys. 93 4180
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2003 0 Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures M. Park, J. J. Cuomo, B. J. Rodriguez, W.-C. Yang, R. J. Nemanich, and O. Ambacher J. Appl. Phys. 93 9542
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2003 0 Wavelength-dependent Raman scattering of hydrogenated amorphous silicon carbon with red, green, and blue light excitation Minseo Park, V. Sakhrani, J.-P. Maria, J. J. Cuomo, C. W. Teng, J. F. Muth, M. E. Ware, B. J. Rodriguez, and R. J. Nemanich J. Mater. Res. 18 768
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2003 0 Analysis of a non-orthogonal pattern of misfit dislocation arrays in SiGe epitaxy on high-index Si substrates Morgan E. Ware, Robert J. Nemanich, Jennifer L. Gray, and Robert Hull Journal of Applied Physics 95 (2003) 115
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2003 0 Response to Comment on `` `Pd growth and subsequent Schottky barrier formation on chemical vapor cleaned p-type GaN surfaces' '' [J. Appl. Phys. 91, 732 (2002)] P. J. Hartlieb, A. Roskowski, R. F. Davis, W. Platow, and R. J. Nemanich J. Appl. Phys. 93 3679
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2003 0 Band offset measurements of the Si3N4/GaN (0001) interface T. E. Cook, Jr., C. C. Fulton, W. J. Mecouch, R. F. Davis, G. Lucovsky and R. J. Nemanich Journal of Applied Physics, 94(6) 3949
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2003 0 Band offset measurements of the GaN (0001)/HfO2 interface T. E. Cook, Jr., C. C. Fulton, W. J. Mecouch, R. F. Davis, G. Lucovsky, and R. J. Nemanich J. Appl. Phys. 94(11) 7155
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2003 0 Measurements of the Band Offset of SiO2 on Clean n- and p-type GaN T.E. Cook, Jr., E.H. Hurt, C.C. Fulton, W.J. Mecouch, K.M. Tracy, R.F. Davis, G. Lucovsky, and R.J. Nemanich Journal of Applied Physics, 93 3995
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2003 0 Photo-Electron Emission Microscopy (PEEM) observation of inversion domain boundaries of GaN-based lateral polarity heterostructures W.-C. Yang, B.J. Rodriguez, M. Park, R.J. Nemanich, V. Cimalla, O. Ambacher J. Appl. Phys. 94, 5720 (2003) 0
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2003 0 Attractive Migration and Coalescence: A Significant Process in the Coarsening of TiSi2 Islands on the Si(111) Surface W.-C. Yang, M. Zeman, H. Ade, and R. J. Nemanich Phys. Rev. Lett. 90 136102
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2002 0 Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films A. Gruverman, B. J. Rodriguez, R. J. Nemanich, and A. I. Kingon Journal of Applied Physics 2734
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2002 0 Measurements of the Effective Piezoelectric Constant of Nitride Thin Films and Heterostructures using Scanning Force Microscopy B. J. Rodriguez, D-J. Kim, A.I. Kingon and R.J. Nemanich Fall MRS 2001, GaN and Related Alloys, Boston, Ma, Mat. Res. Soc., Warrendale, Pa., 2002. 1
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2002 0 Piezoresponse force microscopy for piezoelectric measurements of III-Nitride materials B.J. Rodriguez, A. Gruverman, A.I. Kingon, R.J. Nemanich Journal of Crystal Growth 246, 252-258 (2002) 252
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2002 0 Electronic States at the Interface of Ti-Si Oxide on Si(100) C.C. Fulton, G. Lucovsky, and R.J. Nemanich JVST B 20(4) 1726
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2002 0 Electrical, Structural and Microstructural Characteristics of As-Deposited and Annealed Pt and Au Contacts on Chemical-Vapor-Cleaned GaN Thin Films E.A. Preble, K.M. Tracy, S. Kiesel, H. McLean, P.Q. Miraglia, R.J. Nemanich, R.F. Davis, M. Albrecht and David J. Smith J Appl. Phys., 91, 4 2133
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2002 0 Measurements of the Band Offset of SiO2 on Clean GaN E.H. Hurt, T.E. Cook Jr., K.M. Tracy, R.F. Davis, G. Lucovsky, and R.J. Nemanich Mat. Res. Soc. Symp Proc. Vol. (693), 557, 2001 557
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2002 0 Analysis of Ti-silicide formation with a thin Ta interlayer on Si (100) Hyeongtag Jeon, Heykyoung Won, Yangdo Kim, Jaeseob Lee, and R. J. Nemanich JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 40 (5) 903
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2002 0 Current--voltage and imaging of TiSi2 islands on Si(001) surfaces using conductive-tip atomic force microscopy Jaehwan Oh and R. J. Nemanich J. Appl. Phys. 92 3326
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2002 0 Single electron tunneling of nanoscale TiSi2 islands on Si Jaehwan Oh, Vincent Meunier, Hoon Ham, and R. J. Nemanich J. Appl. Phys. 92 3332
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2002 0 Enhanced low-temperature thermionic field emission from surface-treated N-doped diamond films Kock FAM, Garguilo JM, Brown B, Nemanich RJ Diamond And Related Materials, 11 (3-6) 774
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2002 0 X-ray and Raman Analysis of GaN Produced by Ultrahigh-Rate Magnetron Sputter Epitaxy M. Park, J-P. Maria J.J. Cuomo, Y.C. Chang, J.F. Muth, R.M. Kolbas, R.J. Nemanich, E. Carlson, J. Bumgarner App Phys Letters 1797
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2002 0 Superhard Phase Composed of Single-wall Carbon Nanotubes M. Popov, M. Kyotani, R. J. Nemanich and Y. Koga Phys. Rev. B, Condensed Matter, 65 (3) art.no. 033408 33408
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2002 0 Chemical, Electrical, and Structural Properties of Au/Pd Contacts on Chemical Vapor Cleaned p-type GaN Surfaces P. J. Hartlieb, A. Roskowski, B. J. Rodriguez, R. J. Nemanich, and R. F. Davis Fall MRS 2001, GaN and Related Alloys, Boston, Ma, Mat. Res. Soc., Mat. Res. Soc. Symp. Proc. Vol. 693 Warrendale, Pa., 2002. 0
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2002 0 Pd growth and subsequent Schottky barrier formation on chemnical vapor cleaned p-type GaN Surface P. J. Hartlieb, A. Roskowski, R. F. Davis, W. Platow and R. J. Nemanich J. Appl. Phys., 91, 2 732
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2002 0 Chemical, Electrical, and Structural Properties of Ni/Au Contacts on Chemical Vapor Cleaned p-typed GaN P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich GaN and Related Alloys, edited by J.E. Northrup, J. Neugebauer, S.F. Chichibu, D.C. Look and H. Riechert (Mater. Res. Soc. Proc. Vol. 693 0
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2002 0 Chemical, Electrical, and Structural Properties of Ni/Au Contacts on Chemical Vapor Cleaned p-typed GaN P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich J Appl Phy, 91, (11) 9151
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2002 0 TiC nanoisland formation on 6H-SiC(0001)(Si) Platow W, Oh J, Nemanich RJ, Sayers DE, Hartman JD, Davis RF J Appl Phys. 91 (9) 6081
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2002 0 Piezoresponse force microscopy for polarity imaging of GaN Rodriguez BJ, Gruverman A, Kingon AI, Nemanich RJ, Ambacher O. Appl Phys Let, 80 (22) 4166
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2001 0 CW Ar-Ion Laser Crystallization of a-Si:H Thin Films A. Sunda-Meya, D.Gracin, J.Dutta, B. Vlahovic, R.J. Nemanich Mat. Res. Soc. Symp. Proc. , Vol. 664, A6.9 0
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2001 0 Quantitative analysis of a-Si1-x Cx:H: H thin films by vibrational spectroscopy and nuclear methods D. Gracin, K. Bogdanovic, V. Borjanovic, M. Jaksic, Z. Pastuovic, J. M. Dutta, B. Vlahovic and R. J. Nemanich Vacuum 61, (2-4) 303
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2001 0 Selective bond breaking in amorphous hydrogenated silicon by using Duke FEL D. Gracin, V. Borjanovic, B. Valhovic, A. Sunda-Meya, T. M. Patterson, J. M. Dutta, S. Hauger, I. Pinayev, M. E. Ware, D. Alexson, R. J. Nemanich and B. von Roedern Nuclear instruments & methods in Physics research. Section A, Accelerators, spectrometers, detectors and associated equipment. 475(1-3) 635
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2001 0 Ultraviolet Raman Study of A1(LO) and E2 Phonons in InxGa1-xN Alloys Dimitri Alexson, Leah Bergman, Mitra Dutta, Michael A. Stroscio, C. A. Parker, S. M. Bedair, N. A. El-Masry, Fran Adar and R. J. Nemanich J. Appl. Phys. 89 (1) 798
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2001 0 Imaging electron emission from diamond films surfaces: N-doped diamond vs. nanostructured diamond F. A. M. Koeck, J. M. Garguilo and R. J. Nemanich Diamond and Related Materials, 10 1714
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2001 348 Thermionic FEEM, PEEM and I/V Measurements of Hydrogen Terminated N-Doped CVD Diamond Surfaces F. A. M. Koeck, J. M. Garguilo, B. Brown and R. J. Nemanich Proceedings of Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga 126
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2001 349 Field Emission, PEEM and FEEM Measurements of Emitting Sites of MPCVD grown NanoCrystalline diamond Films J. M. Garguilo, F. A. M. Koeck, Billyde Brown and R. J. Nemanich Proceedings of Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga 133
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2001 0 Wafer Bonding of Silicon Carbide and Gallium Nitride Jaeseob Lee, T.E. Cook, E.N. Bryan, J.D. Hartman, R.F. Davis, and R.J. Nemanich Mat. Res. Soc. Symp. Proc. Vol(681E), I2.4, 2001 0
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2001 0 Phonons in III-V nitrides: Confined phonons and interface phonons M. Dutta, D. Alexson, L. Bergman, R. J. Nemanich, R. Dupuis, K. W. Kiim, S. Komirenko, and M. Stroscio Physica. E 11, (Low-dimensional systems and nanostructures) 277
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2001 350 High-Pressure Polymerization of Single Wall Carbon Nanotubes M. Popov, M. Kyotani, Y. Koga and R. J. Nemanich Proceedings of Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga 681
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2001 0 Optical Characterization of Wide Bandgap Amorphous Semiconductors (a-Si:C:H)-Effect of Hydrogen Dilution Minseo Park, C. W. Teng, V. Sakhrani, M. B. McLaurin, R. M. Kolbas, R. C. Sanwald, R. J. Nemanich, J. J. Hren and J. J. Cuomo J. Appl. Phys. 89 (2) 1130
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2001 0 Photon energy dependence of contrast in photoelectron emission microscopy of Si devices V. W. Ballarotto, K. Siegrist, R. J. Phaneuf, E. D. Williams, W. -C. Yang and R. J. Nemanich Appl. Phys. Lett. 78 (22) 3547
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2001 347 UV-FEL Photo-Electron Emission Microscopy of the Dynamics of Nanostructures on Silicon Surfaces W. C. Yang, H. Ade and R. J. Nemanich ?Laser Applications in Microelectronic and Optoelectronic Manufacturing VI,? Edited by M. C. Gower, H. Helvajian, K. Sugioka and J. J. Dubowski. (SPIE, Bellingham, WA, 2001) SPIE Vol. 4274 168
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2001 343 XAFS Studies of the Formation of Cobalt Silicide on (3^(1/2) by 3^(1/2) SiC(0001) W. Platow, D. K. Wood, J. E. Burnette, R. J. Nemanich and D. E. Sayers J. Synchrotron Rad. 8 475
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2001 0 Formation of Cobalt Disilicide Films on (3 by 3) 6H-SiC (0001) W. Platow, D. K. Wood, K. M. Tracy, J. E. Burnette, R. J. Nemanich and D. E. Sayers Phys. Rev. B, 63 115312
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2001 0 Growth of epitaxial CoSi2 on 6H-SiC (0001) Si W. Platow, R. J. Nemanich, D. E. Sayers, J. D. Hartman and R. F. Davis J. Appl. Phys., 90, 12 5924
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2000 0 Measurement of Field Emission from Nitrogen-Doped Diamond Films A. T. Sowers, B. L. Ward, S. L. English and R. J. Nemanich Diamond and Related Materials 9, (9-10) 1569
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2000 0 Schottky barrier height and electron affinity of titanium on AlN B. L. Ward, J. D.Hartman, E. H. Hurt, K. M. Tracy, R. F. Davis and R. J. Nemanich J. Vac. Sci. Tech. B 18 (4) 2082
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2000 0 Growth and Characterization of GaN single crystals C. M. Balkas, Z. Sitar, L. Bergman, I. K. Shmagin, J. F. Muth, R. Kolbas, R. J. Nemanich and R. F. Davis J. Cryst. Growth 208 100
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2000 337 Thermionic FEEM, PEEM and I/V Measurements of N-Doped CVD Diamond Surfaces F. A. M. Koeck, J. M. Garguilo, B. Brown and R. J. Nemanich Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays, edited by Kevin L. Jensen, Robert J. Nemanich, Paul Holloway, Troy Trottier, William Mackie, Dorota Temple and Junji Itoh (Mat. Res. Soc. Proc. Vol 621 0
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2000 336 Anomalous Field Enhancement in Planar Semiconducting Cold Cathodes from Spontaneous Ordering in the Accumulation Region Griff L. Bilbo and Robert J. Nemanich Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays, edited by Kevin L. Jensen, Robert J. Nemanich, Paul Holloway, Troy Trottier, William Mackie, Dorota Temple and Junji Itoh (Mater. Res. Soc. Symp. Proc. Vol. 621 0
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2000 0 Nongeometric field enhancement in semiconducting cold cathodes and in metal-insulator-semiconductor structures Griff L. Bilbro and Robert J. Nemanich Appl. Phys. Lett. 76, (7) 891
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2000 0 Effects of a Ta interlayer on the phase transition of TiSi2 on Si (111) Hyeongtag Jeon, Bokhee Jung, Young Do Kim, Woochul Yang and R. J. Nemanich J. Appl. Phys. 88 (5) 2467
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2000 338 Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001) J. D. Hartman, K. Naniwae, C. Petrich, V. Ramachandran, R. M. Feenstra, R. J. Nemanich and R. F. Davis Materials Science Forum 338-342, Pt. 1 353
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2000 0 Spatial Variation of Ferroelectric Properties in Pb(Zr0.3,Ti0.7)03 Thin Films Studied by Atomic Force Microscopy James A. Christman, Seung-Hyun Kim, Hiroshi Maiwa, Jon-Paul Maria, Angus I. Kingon, Brian Rodriguez and R. J. Nemanich J. Appl. Phys. 87 (11) 8031
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2000 0 Effect of Interface Manipulation for MBE Growth of AIN on 6H-SiC Koichi Naniwae, Jeff Hartman, Chris Petrich, Robert F. Davis and Robert J. Nemanich Wide-bandgap Electronic Devices, Editors: R. J. Shul, F. Ren, M. Murakami, W. Pletschen (Mater. Res. Soc. Symp. Proc. Vol. 621 0
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2000 0 Photoluminescence and recombination mechanisms in GaN/Al0.2Ga0.8N superlatice Leah Bergman, Mitra Dutta, M. A. Stroscio, S. M. Komirenko, C. J. Eiting, D. J. H. Lambert, H. K. Kwon, R. D. Dupuis and R. J. Nemanich Appl. Phys Lett. 76 (15) 1969
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2000 0 Photoemission of the SiO2-SiC Hetero-Interface M. L. OBrien, C. Koitzsch and R. J. Nemanich Proc. of Int. Conf. on Silicon Dielectric Interfaces, and J. Vac. Sci. Tech. B 18, (3) 1776
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2000 0 Photoemission of the SiO2-SiC Hetero-Interface M. L. OBrien, C. Koitzsch and R. J. Nemanich Proc. of Int. Conf. on Silicon Dielectric Interfaces, and J. Vac. Sci. Tech. B 18, (3) 1776
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2000 339 Electron Emission from Carbon Films: Issues of Uniformity R. J. Nemanich, F. A. M. Koeck, and J. Garguilo Proc. of First International Symposium on Cold Cathodes, The Electrochemical Society, Vol. 2000 (28) Editors M. Cahay, K. L. Jensen, P. D. Mumford, J. Yater, R. A. Murphy, D. Temple and V. J. Kapoor 193
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2000 333 Surface Residue Islands Nucleation in Anhydrous HF/Alcohol Vapor Processing of Si Surfaces Richard J. Carter, John R. Hauser and Robert J. Nemanich J. Electrochem. Soc. 147 (9) 3512
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1999 309 Cobalt silicide formation on 6H silicon carbide A. O. Porto, B. I. Boyanov, D. E. Sayers and R. J. Nemanich J. Synchrotron Rad. 6 188
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1999 307 Hydrogen Plasma Removal of Post-RIE Residue for Backend Procesing A. Somashekhar, H. Ying, P. B. Smith, D. B. Aldrich and R. J. Nemanich Journal of Electrochemical Society 146, (6) 2318
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1999 0 Field Emission Properties of Nitrogen-Doped Diamond Films A. T. Sowers, B. L. Ward, S. L. English and R. J. Nemanich Journal of Appl. Phys, 86, (7) 3973
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1999 0 Growth of Epitaxial CoSi2 on SiGe(001) B. I. Boyanov, P. T. Goeller, D. E. Sayers and R. J. Nemanich J. Appl. Phys. 86, (2) 1355
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1999 321 Reduction of the Phase Transition Temperature of TiSi2 on Si(111) using a Ta Interlayer Bokhee Jung, Young Do Kim, Woochul Yang, R. J. Nemanich and Hyeongtag Jeon Advanced Interconnects and Contacts, editors: D. C. Edelstein, T. Kikkawa, M. C. Ozturk, K. N. Tu, and E. J. Weitzman, (Mater. Res. Soc. Symp. Proc. Vol. 564 59
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1999 308 The effect of germanium on the CoSiGe thin-film reaction Boyan I. Boyanov, Peter T. Goeller, Dale E. Sayers and Robert J. Nemanich J. Synchrotron Rad. 6 521
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1999 0 Confined phonons and phonon-mode properties of III-V nitrides with wurtzite crystal structure D. Alexson, Leah Bergman, Mitra Dutta, K. W. Kim, S. Komirenko, Robert J. Nemanich, B. C. Lee, Michael A. Stroscio, and SeGi Yu Physica B 263-264 510
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1999 311 Thermochemical stability of silicon-oxygen-carbon alloy thin films: A model system for chemical and structural relaxation at SiC-SiO2 interfaces D. M. Wolfe, B. J. Hinds, F. Wang, G. Lucovsky, B. L. Ward, M Xu, R. J. Nemanich and D. M. Maher J. Vac. Sci. Technol. A 17, (4) 2170
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1999 0 Role of the substrate strain in the sheet resistance stability of NiSi deposited on Si(100) Eliane Maillard-Schaller, B.I. Boyanov, S. English and R.J. Nemanich J. Appl. Physics 85, (7) 3614
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1999 323 Electrical Properties of Nanoscale TiSi2 Islands on Si Jaehwan Oh, Hoon Ham, Peter Laloli and R. J. Nemanich Self-Organized Processes in Semiconductor Alloys, edited by A. Mascarenhas, D. Follstaedt, T. Suzuki and B. Joyce, (Mater. Res. Soc. Vol. 583 111
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1999 312 Phonon Dynamics and Lifetimes of AlN GAN Crystallites Leah Bergman, Dimitir Alexson, Robert J. Nemanich, Mitra Dutta, Michael A. Stroscio, Cengiz Balkas and Robert F. Davis GaN and Related Alloys, edited by Stephen J. Pearton, Chihping Kuo, Alan F. Wright and Takeshi Uenoyama (Mat. Res. Soc. Symp Proc. Vol. 537, Spring, San Francisco, CA) and MRS Internet J NSR 4, U794-799, Suppl. 1 0
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1999 0 Raman Analysis of Phonon Lifetimes in AlN and GaN of Wurtzite Structure Leah Bergman, Dimitri Alexson, Patrick L. Murphy, Mitra Dutta, Michael A. Stroscio, Cengiz Balkas, Hyumin Shin, Robert F. Davis and Robert J. Nemanich Phys. Rev. B 59, (20) 12977
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1999 0 Raman Analysis of the E1 and A1 Quasi-LO and -TO Modes in Wurtzite AlN Leah Bergman, Mitra Dutta, Cengiz Balkas, Robert F. Davis, James A. Christman, Dimitir Alexson and R. J. Nemanich J. Appl. Phys 85, (7) 3535
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1999 322 Stress Relaxation in Uniquely Oriented SiGe/Si Epitaxial Layers M. E. Ware and R. J. Nemanich Thin Films: Stresses and Mechanical Properties VIII, edited by R. Vinci, O. Kraft, N. Moody, P. Besser, and E. Shaffer, II. (Mater. Res. Soc. Symp. Proc. Vol. 594 163
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1999 0 Effect of nitrogen incorporation on electron emission from chemical vapor deposited diamond M. Park, A. T. Sowers, C. Lizzul Rinne, R. Schlesser, L. Bergman, R. J. Nemanich, Z. Sitar, J. J. Hren, J. J. Cuomo, V. V. Zhirnov and W. B. Choi J. Vac. Sci. Technol. B 17, (2) 734
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1999 0 Raman Analysis and Field Emission Study of Ion Beam Etched Diamond Films M. Park, D. R. McGregor, L. Bergman, R. J. Nemanich, J. J. Hren, J. J. Cuomo, W. B. Choi and V. V. Zhirnov J. Vac. Sci. Technol. B 17, (2) 700
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1999 0 Raman scattering of tetrahedrally-bonded amorphous carbon deposited at oblique angles M. Park, S. M. Camphausen, A. F. Myers, P. T. Barletta, V. Sakhrani, L. Bergman, R. J. Nemanich and J. J. Cuomo Materials Letters 41, (5) 229
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1999 317 Germanium Segregation in the Co/SiGe Si(001) thin film system Peter T. Goeller, Boyan I. Boyanov, Dale Sayers, Robert J. Nemanich, Alline F. Myers and Eric B. Steel J. Mater. Res. 14, (11) 4372
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1999 326 The Role of Oxide Impurities in Surface Residue Nucleation Due to Anhydrous HF/Methanol Vapor Phase Cleaning R. J. Carter, J. R. Hauser, and R. J. Nemanich Sixth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, Electrochemical Society Proceedings Vol. 99-36 137
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1999 325 Correlation of Photo Electron Emission Microscopy and Field Emission from Nitrogen-Doped Diamond Films R. J. Nemanich, F. A. M. Koeck, S. L. English and A. T. Sowers Sixth International Symposium on Diamond Materials, Electrochemical Society Proceedings Vol. 99-32 Honolulu, Hawaii 206
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1999 300 Electron Emission from Crystalline Diamond Surfaces R. J. Nemanich, P. K. Baumann, A. T. Sowers and B. L. Ward Advances in Science and Technology 21, Proceedings of Topical Symposium IV- Diamond Films: Synthesis, Processing and Applications, 9th Cimtec-World Forum on New Materials Symposium, Techna Srl 217
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1999 0 Imaging Electron Emission from Diamond and III-V Nitride Surfaces with Photo-Electron Emission Microscopy R. J. Nemanich, S. L. English, J. D. Hartman, A. T. Sowers, B. L. Ward, H. Ade and R. F. Davis Applied Surface Science 146 287
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1999 318 An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique S. H. Kim, D. J. Kim, K. M. Lee, M. Park, A. I. Kingon, R. J. Nemanich, J. Im and S. K. Streiffer J. Mater. Res. 14, (11) 4395
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1999 0 X-ray Photoelectron Spectroscopy Analysis of GaN/(0001)/AlN and AlN/(0001) GaN Growth Mechanisms S. W. King, E. P. Carlson, R. J. Therrien, J. A. Christman, R. J. Nemanich and R. F. Davis J. Appl. Phys. 86, (10) 5584
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